Key Research Areas
Energy conversion, power semiconductor devices and the defects that limit both — measured on instruments the group designed and built, and answered by calculation as well as experiment.
Six lines of work, held together by one question: what do defects do to the electrical and thermal transport of a semiconductor, and how far can that be turned to use. They map onto three national programmes directly — the India Semiconductor Mission needs qualified contacts and radiation-tolerant devices on SiC and GaN, which is what the DRDO CARS work delivers; the National Quantum Mission needs deep-level spectroscopy of the single-defect states that decide coherence and yield in wide-bandgap and 2D platforms, which is what the DLTS facility measures; and the Indian space programme needs mirrors, detectors and electronics that survive the radiation environment, which is what the ISRO RESPOND project and the carbon-nanotube work address.
Turning a Temperature Difference into Current
A thermoelectric leg makes electricity from a temperature gradient with no moving parts, no working fluid and nothing to service. The group works on all four families at once — inorganic (Bi2Te3 co-doped with Sn and Zn, CoSb3, SrTiO3, and the wide-bandgap route through GaN and β-Ga2O3), organic (PEDOT:PSS, FeCl3-doped P3HT), hybrid (PEDOT:PSS/Bi2Te3 with reduced graphene oxide, PVDF with nickel nanowires), and flexible and printed devices built from them.
Two results anchor the line. Bismuth telluride, the industry standard, gives up above about 150 °C; GaN and β-Ga2O3 keep working far beyond it, and the group published the first wide-temperature Seebeck and Hall study of β-Ga2O3 single crystals across 80–630 K. On the printable side, adding reduced graphene oxide to a PEDOT:PSS/Bi2Te3 film raised the power factor enough to win the RSC Advances Outstanding Student Paper Award for 2024.
Key papers
- Wide Range (80–630 K) Seebeck Study of β-Ga2O3 Single Crystals · Appl. Phys. Lett. 2021
- GaN Thermoelectric Properties: Experimental & DFT Study · Phys. Chem. Chem. Phys. 2021
- PEDOT:PSS/Bi2Te3/rGO Ternary Composite Films · RSC Advances 2024 — RSC Outstanding Student Paper Award
- PVDF/Ni-NW Composite Films: n-Type Thermoelectric for Flexible Harvesting · Polym. Compos. 2025
Devices That Hold Up at High Field, High Temperature and High Dose
The materials are SiC, GaN, β-Ga2O3 and graphene on silicon; the devices are Schottky diodes, AlGaN/GaN HEMTs, photodetectors and heterostructures. What decides whether any of them works is the interface: the metal–semiconductor contact, the barrier it forms, and the states sitting at it.
Chemically passivating a GaN surface with a ruthenium solution raised the Schottky barrier from 0.78 to 0.91 eV and cut reverse leakage by two orders of magnitude — a decade-long line of work, published in Appl. Phys. Lett. in 2014 and again in 2023, and picked up as a Research Review by Compound Semiconductor. The active DRDO CARS project carries it into qualified ohmic and Schottky contact metallurgy on SiC and III–V material for SSPL-DRDO: the contact problem that the India Semiconductor Mission has to solve before domestic power devices become manufacturable.
Key papers
- Barrier Height Enhancement using Ru-Based Passivation · Appl. Phys. Lett. 2014
- Surface States Passivation in GaN by Ruthenium Solution · Appl. Phys. Lett. 2023 — Featured in Compound Semiconductor
- Trap Analysis on Pt-AlGaN/GaN SBD through DLTS · J. Semicond. 2023
- Pt/MoS2 Schottky Barrier Junction Transport · J. Alloys Compd. 2019
Native, Irradiated, Implanted — and Measured While They Form
Every device above is limited by defects the crystal came with and defects something put there. The group treats both: native point defects and dislocations from growth, and induced defects from swift heavy ion irradiation, implantation and gamma exposure. The measurement is deep level transient spectroscopy across 80–500 K, with 1/f noise, Hall transport and admittance spectroscopy alongside it.
The distinctive capability is in-situ DLTS under a live beam: the sample sits in the beamline at the IUAC 15UD Pelletron and the trap spectrum is recorded while ions arrive, rather than reconstructed afterwards from a cooled-down sample. Defect formation and annealing kinetics that post-irradiation measurement simply cannot see — because the transient states have already relaxed — are visible directly. Single-defect spectroscopy of this kind is also what the National Quantum Mission needs from wide-bandgap and 2D platforms, where one charge state decides coherence.
Key papers
- In-Situ DLTS of GaN SBDs under Live SHI Irradiation · Semicond. Sci. Technol. 2018
- Ion-Induced Transformation of Shallow to Deep Defects in GaN · Nucl. Instrum. Methods B 2024
- Swift Heavy Ion Irradiation of GaN: Defect Dynamics (Invited Review) · J. Mater. Sci. Mater. Electron. 2025
- DLTS in Wide-Bandgap Semiconductors: Methods and Defect Fingerprints · Mater. Today Phys. 2026
Every Measurement Answered by a Calculation
A capacitance transient tells you a trap sits 0.6 eV below the conduction band. It does not tell you which atom is missing. The group pairs each experimental campaign with first-principles and transport modelling, so that a measured level can be assigned to a structure rather than catalogued as a number.
The toolchain is SRIM/TRIM for the stopping and range of the incident ion and the damage profile it leaves; molecular dynamics for the cascade and its relaxation; DFT in Quantum ATK and WIEN2k for formation energies, charge-state transition levels, band structure and the Seebeck coefficient from the Boltzmann transport equation. The GaN thermoelectric work and the Heusler alloy screening were both experiment and calculation from the start, not a calculation bolted on afterwards.
Key papers
- Thermoelectric Properties of GaN: Experimental and Theoretical Investigation · Phys. Chem. Chem. Phys. 2021
- First-Principles Study of FeRuTiX Quaternary Heusler Compounds · Z. Anorg. Allg. Chem. 2023
- Ab-Initio Stability of Iridium-Based Full and Quaternary Heusler Alloys · Physica B 2024
More Than Five Instruments, Built Here, at a Fraction of the Price
Commercial systems for this work cost tens of lakhs each and arrive configured for somebody else's experiment. The group designs and commissions its own: five cryogenic measurement systems so far, all still in routine operation, each built for high precision at low cost and each opened to users beyond the group.
The Seebeck and resistivity system (80–650 K, wire, film and bulk) was published in Review of Scientific Instruments in 2019 and is now used by collaborating national groups. Alongside it: a ZT and thermal conductivity system to 1000 K, the in-situ DLTS setup, a 1/f noise measurement system, a dipstick optical cryostat, and a CVD growth system to 1400 °C commissioned in the Department at Central University of Jammu. A DST-FIST pulsed laser deposition system is being procured and will be open to departmental users.
Instrumentation publication
- Apparatus for Seebeck Coefficient Measurement of Wire, Thin Film & Bulk Materials (80–650 K) · Rev. Sci. Instrum. 2019
2D Materials, Carbon Nanotubes, and What Space Asks of Them
Graphene, MoS2 and multilayer carbon structures behave differently enough from bulk semiconductors that the defect toolkit has to be re-derived for them. Negative oxygen-ion bombardment of CVD graphene moves the Raman disorder ratio, the defect density and the Fermi level together, and the group has mapped that trajectory against fluence. Pt/MoS2 junctions give a Schottky barrier with a controllable inhomogeneity.
The application that pulls hardest is space. Carbon nanotube and nanomaterial multilayers are the candidate mirror and detector coatings for extreme-ultraviolet and soft X-ray polarimetry, and the ISRO RESPOND project is building prototypes for a future Indian polarimetric mission. The same materials have to survive the same radiation environment the defect work characterises, which is why the two lines share a beamline.
Key papers
- Structural and Electrical Changes in Multilayer Graphene by Negative Oxygen Ion Bombardment · Results Surf. Interfaces 2025
- Oxygen Ion Irradiation: Structural Modifications of CVD-Grown Graphene · Nucl. Instrum. Methods B 2024
- Graphene-Derived Composites in Thermoelectric Energy Conversion (Review) · Energy Adv. 2024
Experimental Infrastructure
The Energy Materials & Devices Laboratory houses five indigenous precision measurement systems, each independently designed and commissioned by the group. This in-house instrumentation provides full experimental control across a wide range of conditions, without dependence on shared or commercial infrastructure.
The lab enables continuous measurement from liquid nitrogen temperature (80 K) to 1000 K, spanning cryogenic solid-state physics through high-temperature thermoelectric characterisation. Systems include Seebeck/resistivity, ZT, in-situ DLTS under live ion-beam, 1/f noise, and a dipstick optical cryostat.
The in-situ DLTS system, operated at the IUAC beamlines (New Delhi), represents a unique experimental facility — no other Indian group has demonstrated real-time DLTS of semiconductor devices under live swift heavy ion irradiation.
Custom Measurement Systems
System I — Seebeck & Resistivity
Circuit diagram of the custom-built measurement setup. DMM + SMU controlled via IEEE-488 with LabVIEW automation.
Versatile system for simultaneous Seebeck coefficient and electrical resistivity measurement of wires, thin films, and bulk materials from liquid nitrogen to above room temperature.
System II — ZT & Thermal Conductivity
Complete thermoelectric figure-of-merit (ZT) characterisation for bulk pellets and sintered materials at elevated temperatures. Full thermoelectric characterisation suite in a single lab.
System IV — 1/f Noise Measurement
Custom-built low-noise electronics with cryogenic access for 1/f (flicker) noise spectroscopy of thin films, epilayers, and devices. 1/f noise is a sensitive probe of defect concentration and quality.
System V — Dipstick Optical Cryostat
Schematic of the dipstick cryostat design showing the sample stage, feed-through, vacuum assembly, and wiring layout (numbered components 1–11).
Low-temperature optical system enabling simultaneous photoluminescence, optical absorption, and electrical transport characterisation. Designed for in-situ optical probing at cryogenic temperatures.
Funded Projects (Principal Investigator)
🟢 Ongoing Projects
Nanomaterials Prototype for EUV / X-ray Polarimetric Missions
ISRO RESPOND · RES-URSC-2023-010 · 2024–2027 · 2 manuscripts in progress
High-Quality Ohmic and Schottky Contacts on SiC and III–V Semiconductors
DRDO CARS · 2023–2026 · with SSPL-DRDO, Delhi
Ion-Beam-Induced Defect Engineering for Thermoelectrics
IUAC UFR-76304 · 2024–2027 · in-situ measurement under live beam
✓ Completed Projects
All-Printed Thermoelectric Generators
Completed Oct 2020 – Oct 2022 · IUAC & UPES Dehradun · as PI
Defect-Assisted Current Transport in III-V Semiconductors for Thermoelectric/Energy Applications
DST-INSPIRE Faculty Project · Completed Aug 2015 – Aug 2020 · IUAC
Electrical Characterisation Facility
UPES SEED Infra Grant · as PI · impedance measurement spectroscopy, I–V and C–V
Thermoelectric Transport Measurement Set-ups
UPES SEED Infra Grant · as PI · Seebeck coefficient and thermal conductivity measurement
Defect-Assisted Current Transport in III-V Semiconductors
Collaborative Research Scheme · 2022–2023 · as PI · beam time and characterisation support




