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Key Research Areas

Energy conversion, power semiconductor devices and the defects that limit both — measured on instruments the group designed and built, and answered by calculation as well as experiment.

Six lines of work, held together by one question: what do defects do to the electrical and thermal transport of a semiconductor, and how far can that be turned to use. They map onto three national programmes directly — the India Semiconductor Mission needs qualified contacts and radiation-tolerant devices on SiC and GaN, which is what the DRDO CARS work delivers; the National Quantum Mission needs deep-level spectroscopy of the single-defect states that decide coherence and yield in wide-bandgap and 2D platforms, which is what the DLTS facility measures; and the Indian space programme needs mirrors, detectors and electronics that survive the radiation environment, which is what the ISRO RESPOND project and the carbon-nanotube work address.

01
Energy — Thermoelectric Power Conversion

Turning a Temperature Difference into Current

A thermoelectric leg makes electricity from a temperature gradient with no moving parts, no working fluid and nothing to service. The group works on all four families at once — inorganic (Bi2Te3 co-doped with Sn and Zn, CoSb3, SrTiO3, and the wide-bandgap route through GaN and β-Ga2O3), organic (PEDOT:PSS, FeCl3-doped P3HT), hybrid (PEDOT:PSS/Bi2Te3 with reduced graphene oxide, PVDF with nickel nanowires), and flexible and printed devices built from them.

Two results anchor the line. Bismuth telluride, the industry standard, gives up above about 150 °C; GaN and β-Ga2O3 keep working far beyond it, and the group published the first wide-temperature Seebeck and Hall study of β-Ga2O3 single crystals across 80–630 K. On the printable side, adding reduced graphene oxide to a PEDOT:PSS/Bi2Te3 film raised the power factor enough to win the RSC Advances Outstanding Student Paper Award for 2024.

Organic · Inorganic · Hybrid Flexible & printed devices Seebeck · ZT · κ SERB · DST-INSPIRE funded

Key papers

  • Wide Range (80–630 K) Seebeck Study of β-Ga2O3 Single Crystals · Appl. Phys. Lett. 2021
  • GaN Thermoelectric Properties: Experimental & DFT Study · Phys. Chem. Chem. Phys. 2021
  • PEDOT:PSS/Bi2Te3/rGO Ternary Composite Films · RSC Advances 2024 — RSC Outstanding Student Paper Award
  • PVDF/Ni-NW Composite Films: n-Type Thermoelectric for Flexible Harvesting · Polym. Compos. 2025
02
Power Semiconductor Devices

Devices That Hold Up at High Field, High Temperature and High Dose

The materials are SiC, GaN, β-Ga2O3 and graphene on silicon; the devices are Schottky diodes, AlGaN/GaN HEMTs, photodetectors and heterostructures. What decides whether any of them works is the interface: the metal–semiconductor contact, the barrier it forms, and the states sitting at it.

Chemically passivating a GaN surface with a ruthenium solution raised the Schottky barrier from 0.78 to 0.91 eV and cut reverse leakage by two orders of magnitude — a decade-long line of work, published in Appl. Phys. Lett. in 2014 and again in 2023, and picked up as a Research Review by Compound Semiconductor. The active DRDO CARS project carries it into qualified ohmic and Schottky contact metallurgy on SiC and III–V material for SSPL-DRDO: the contact problem that the India Semiconductor Mission has to solve before domestic power devices become manufacturable.

SiC · GaN · Ga2O3 · Graphene/Si Schottky · HEMT · photodetector Ohmic contact metallurgy DRDO CARS funded

Key papers

  • Barrier Height Enhancement using Ru-Based Passivation · Appl. Phys. Lett. 2014
  • Surface States Passivation in GaN by Ruthenium Solution · Appl. Phys. Lett. 2023 — Featured in Compound Semiconductor
  • Trap Analysis on Pt-AlGaN/GaN SBD through DLTS · J. Semicond. 2023
  • Pt/MoS2 Schottky Barrier Junction Transport · J. Alloys Compd. 2019
03
Defects in Semiconductors

Native, Irradiated, Implanted — and Measured While They Form

Every device above is limited by defects the crystal came with and defects something put there. The group treats both: native point defects and dislocations from growth, and induced defects from swift heavy ion irradiation, implantation and gamma exposure. The measurement is deep level transient spectroscopy across 80–500 K, with 1/f noise, Hall transport and admittance spectroscopy alongside it.

The distinctive capability is in-situ DLTS under a live beam: the sample sits in the beamline at the IUAC 15UD Pelletron and the trap spectrum is recorded while ions arrive, rather than reconstructed afterwards from a cooled-down sample. Defect formation and annealing kinetics that post-irradiation measurement simply cannot see — because the transient states have already relaxed — are visible directly. Single-defect spectroscopy of this kind is also what the National Quantum Mission needs from wide-bandgap and 2D platforms, where one charge state decides coherence.

Native & induced defects DLTS · 1/f noise · Hall 100–200 MeV O, Ag, Ni, Au IUAC UFR funded
In-situ DLTS under a live swift-heavy-ion beam — the only facility of its kind anywhere.

Key papers

  • In-Situ DLTS of GaN SBDs under Live SHI Irradiation · Semicond. Sci. Technol. 2018
  • Ion-Induced Transformation of Shallow to Deep Defects in GaN · Nucl. Instrum. Methods B 2024
  • Swift Heavy Ion Irradiation of GaN: Defect Dynamics (Invited Review) · J. Mater. Sci. Mater. Electron. 2025
  • DLTS in Wide-Bandgap Semiconductors: Methods and Defect Fingerprints · Mater. Today Phys. 2026
04
A Dual Approach — Experiment with Theory Behind It

Every Measurement Answered by a Calculation

A capacitance transient tells you a trap sits 0.6 eV below the conduction band. It does not tell you which atom is missing. The group pairs each experimental campaign with first-principles and transport modelling, so that a measured level can be assigned to a structure rather than catalogued as a number.

The toolchain is SRIM/TRIM for the stopping and range of the incident ion and the damage profile it leaves; molecular dynamics for the cascade and its relaxation; DFT in Quantum ATK and WIEN2k for formation energies, charge-state transition levels, band structure and the Seebeck coefficient from the Boltzmann transport equation. The GaN thermoelectric work and the Heusler alloy screening were both experiment and calculation from the start, not a calculation bolted on afterwards.

SRIM / TRIM Molecular dynamics DFT — Quantum ATK, WIEN2k Boltzmann transport

Key papers

  • Thermoelectric Properties of GaN: Experimental and Theoretical Investigation · Phys. Chem. Chem. Phys. 2021
  • First-Principles Study of FeRuTiX Quaternary Heusler Compounds · Z. Anorg. Allg. Chem. 2023
  • Ab-Initio Stability of Iridium-Based Full and Quaternary Heusler Alloys · Physica B 2024
05
Building the Infrastructure

More Than Five Instruments, Built Here, at a Fraction of the Price

Commercial systems for this work cost tens of lakhs each and arrive configured for somebody else's experiment. The group designs and commissions its own: five cryogenic measurement systems so far, all still in routine operation, each built for high precision at low cost and each opened to users beyond the group.

The Seebeck and resistivity system (80–650 K, wire, film and bulk) was published in Review of Scientific Instruments in 2019 and is now used by collaborating national groups. Alongside it: a ZT and thermal conductivity system to 1000 K, the in-situ DLTS setup, a 1/f noise measurement system, a dipstick optical cryostat, and a CVD growth system to 1400 °C commissioned in the Department at Central University of Jammu. A DST-FIST pulsed laser deposition system is being procured and will be open to departmental users.

5+ systems designed and built 80 K – 1400 °C High precision, low cost Published Rev. Sci. Instrum.

Instrumentation publication

  • Apparatus for Seebeck Coefficient Measurement of Wire, Thin Film & Bulk Materials (80–650 K) · Rev. Sci. Instrum. 2019
06
New Materials, New Applications

2D Materials, Carbon Nanotubes, and What Space Asks of Them

Graphene, MoS2 and multilayer carbon structures behave differently enough from bulk semiconductors that the defect toolkit has to be re-derived for them. Negative oxygen-ion bombardment of CVD graphene moves the Raman disorder ratio, the defect density and the Fermi level together, and the group has mapped that trajectory against fluence. Pt/MoS2 junctions give a Schottky barrier with a controllable inhomogeneity.

The application that pulls hardest is space. Carbon nanotube and nanomaterial multilayers are the candidate mirror and detector coatings for extreme-ultraviolet and soft X-ray polarimetry, and the ISRO RESPOND project is building prototypes for a future Indian polarimetric mission. The same materials have to survive the same radiation environment the defect work characterises, which is why the two lines share a beamline.

Graphene · MoS2 · CNT EUV / soft X-ray multilayers Radiation-tolerant coatings ISRO RESPOND funded

Key papers

  • Structural and Electrical Changes in Multilayer Graphene by Negative Oxygen Ion Bombardment · Results Surf. Interfaces 2025
  • Oxygen Ion Irradiation: Structural Modifications of CVD-Grown Graphene · Nucl. Instrum. Methods B 2024
  • Graphene-Derived Composites in Thermoelectric Energy Conversion (Review) · Energy Adv. 2024

Experimental Infrastructure

The Energy Materials & Devices Laboratory houses five indigenous precision measurement systems, each independently designed and commissioned by the group. This in-house instrumentation provides full experimental control across a wide range of conditions, without dependence on shared or commercial infrastructure.

The lab enables continuous measurement from liquid nitrogen temperature (80 K) to 1000 K, spanning cryogenic solid-state physics through high-temperature thermoelectric characterisation. Systems include Seebeck/resistivity, ZT, in-situ DLTS under live ion-beam, 1/f noise, and a dipstick optical cryostat.

The in-situ DLTS system, operated at the IUAC beamlines (New Delhi), represents a unique experimental facility — no other Indian group has demonstrated real-time DLTS of semiconductor devices under live swift heavy ion irradiation.

5
Custom Systems
80–1000K
Temperature Range
₹95L
Active Funding
3
Active Projects

Custom Measurement Systems

📄 Published · Rev. Sci. Instrum.

System I — Seebeck & Resistivity

Seebeck & Resistivity Measurement Setup — Circuit Diagram

Circuit diagram of the custom-built measurement setup. DMM + SMU controlled via IEEE-488 with LabVIEW automation.

Versatile system for simultaneous Seebeck coefficient and electrical resistivity measurement of wires, thin films, and bulk materials from liquid nitrogen to above room temperature.

Temperature RangeLN₂ (80 K) – 650 K
Sample GeometryWire · Thin Film · Bulk
PublicationRev. Sci. Instrum. (2019)
UsersMultiple national collaborators
01
🔬 Rare Capability in India

System II — ZT & Thermal Conductivity

ZT & Thermal Conductivity Measurement Setup

Complete thermoelectric figure-of-merit (ZT) characterisation for bulk pellets and sintered materials at elevated temperatures. Full thermoelectric characterisation suite in a single lab.

Temperature Range300 K – 1000 K
Sample TypeBulk Pellets · Sintered Materials
Measuresκ, S, σ → ZT
StatusOperational
02
🔬 Pioneering Capability · In-Situ DLTS under Live SHI Beam

System III — In-Situ DLTS

DLTS System
In-Situ DLTS Setup at IUAC

Real-time deep-level transient spectroscopy of semiconductor devices during live swift heavy ion beam irradiation at IUAC beamlines. Captures defect formation and recovery kinetics impossible to extract from post-irradiation measurements.

Temperature RangeLN₂ – 500 K
CapabilityReal-time under live SHI beam
LocationIUAC Beamlines, New Delhi
World StatusUnique — no other Indian group
03

System IV — 1/f Noise Measurement

Custom-built low-noise electronics with cryogenic access for 1/f (flicker) noise spectroscopy of thin films, epilayers, and devices. 1/f noise is a sensitive probe of defect concentration and quality.

Temperature RangeLN₂ (80 K) – 500 K
Sample TypesThin Films · Epilayers · Devices
ElectronicsCustom low-noise design
04

System V — Dipstick Optical Cryostat

Dipstick Optical Cryostat — Schematic Design

Schematic of the dipstick cryostat design showing the sample stage, feed-through, vacuum assembly, and wiring layout (numbered components 1–11).

Low-temperature optical system enabling simultaneous photoluminescence, optical absorption, and electrical transport characterisation. Designed for in-situ optical probing at cryogenic temperatures.

Temperature RangeLN₂ (80 K) – 500 K
CapabilityOptical + Transport (simultaneous)
AccessDipstick — portable, flexible
05

Bonus — Low-Cost Vacuum Oven

An ingenious low-cost vacuum oven constructed from a desiccator for annealing organic thin film samples (PEDOT:PSS composites) under vacuum — enabling the flexible thermoelectric research programme without expensive commercial equipment.

Temperature RangeRT – 450 K
DesignDesiccator-based vacuum oven
UseOrganic / flexible thermoelectrics
06

CVD System (1400 °C)

High-temperature Chemical Vapour Deposition system capable of operating up to 1400 °C, acquired under an ISRO-sponsored project for the synthesis of carbon nanotubes (CNTs) and related nanostructured carbon materials for space-grade electronic and thermal management applications.

Max Temperature1400 °C
ApplicationCNT synthesis & nanocarbon growth
FundingISRO-sponsored project
07

Funded Projects (Principal Investigator)

₹2.05 Cr
Total External Funding
₹95.38 L
Currently Active
8
Projects as PI
ISRO · DRDO · IUAC
National Agencies

🟢 Ongoing Projects

ISRO

Nanomaterials Prototype for EUV / X-ray Polarimetric Missions

ISRO RESPOND · RES-URSC-2023-010 · 2024–2027 · 2 manuscripts in progress

₹59.31 L
DRDO

High-Quality Ohmic and Schottky Contacts on SiC and III–V Semiconductors

DRDO CARS · 2023–2026 · with SSPL-DRDO, Delhi

₹26.07 L
IUAC

Ion-Beam-Induced Defect Engineering for Thermoelectrics

IUAC UFR-76304 · 2024–2027 · in-situ measurement under live beam

₹10 L

✓ Completed Projects

SERB

All-Printed Thermoelectric Generators

Completed Oct 2020 – Oct 2022 · IUAC & UPES Dehradun · as PI

₹14 L
DST

Defect-Assisted Current Transport in III-V Semiconductors for Thermoelectric/Energy Applications

DST-INSPIRE Faculty Project · Completed Aug 2015 – Aug 2020 · IUAC

₹35 L
UPES

Electrical Characterisation Facility

UPES SEED Infra Grant · as PI · impedance measurement spectroscopy, I–V and C–V

₹33 L
UPES

Thermoelectric Transport Measurement Set-ups

UPES SEED Infra Grant · as PI · Seebeck coefficient and thermal conductivity measurement

₹27 L
UGC-DAE-CSR

Defect-Assisted Current Transport in III-V Semiconductors

Collaborative Research Scheme · 2022–2023 · as PI · beam time and characterisation support

₹0.45 L